The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...