ISSAQUAH, Wash. — In a move to lower the cost of test, Applied Precision LLC here announced a probe-card analyzer said to reduce chip-testing times by up to 200%. The PrecisionPoint VX3 Probe Card ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

Semiconductor probe card and test equipment supplier MPI continues to see a ramp-up in vertical probe card (VPC) orders for network communications and automotive chips. It is expected to post flat or ...

Seamlessly integrated system combines TITAN™ Probes and MPI's wafer-level expertise to unlock precision measurements for next-generation semiconductors and sub-THz applications MPI TITAN™ 250 GHz ...

Taiwan IC test interface solutions providers continue to embrace robust demand from major US HPC processor vendors Intel, Nvidia and AMD, which will effectively offset reductions in shipments to ...

Siemens Digital Industries Software announced Tessent IJTAG Pro software, which will transform IJTAG (IEEE 1687) input/output ...

October 9, 2014. Everett Charles Technologies (ECT) has launched the Z0 and Z1 probes—two new members of the ZIP probe family designed to meet signal-integrity challenges driven by the ever increasing ...

The continuing advances in semiconductor functionality, density, and chip-level integration are generating new challenges in accessing devices for test and controlling the physical and electrical ...

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

MPI Corporation, a global leader in advanced semiconductor test solutions, today announced the release of a fully integrated 250 GHz broadband test solution for the new Keysight NA5305A/7A PNA-X ...