Santa Clara, Calif. — Agilent Technologies Inc. has unveiled a limited access solution for in-circuit test (ICT) users that eliminates the need for physical test points. Part of Agilent's VTEP v2.0 ...
Why are test points a crucial element in developing a successful circuit? Types of test points available, and the different techniques that employ them. Electronic design has always been an endeavor ...
Agilent Technologies’ new Cover-Extend Technology is a hybrid between two established test methods for manufacturing test: boundary scan and VTEP vectorless test. Part of the company’s VTEP v2.0 ...
In New test points slash ATPG test pattern count, I described a new type of test point technology used with scan compression for device testing. The key benefit of using test points with embedded ...