Hackaday

test pattern

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...
Electronic Design

Using Timing Constraints For Generating At-Speed Test Patterns

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...
Electronic Design

Using EDT Test Points to Reduce Test Time and Cost

The exponential growth in design sizes has rendered the traditional methods of design-for-test, layout, and timing closure no longer sufficient. Design and test engineers not only have to constantly ...